Predicting upgrade timing for successive product generations: An exponential-decay proportional hazard model

Xinxue Qu (First Author), Aslan Lotfi (Participant Author), Dipak C. Jain (Participant Author), Zhengrui Jiang (Participant Author)

科研成果: 期刊稿件期刊论文

摘要

In the presence of successive product generations, most consumers are repeat buyers who may decide to purchase a future product generation even before its release. Therefore, after a new product generation enters the market, its sales often exhibit a declining pattern, which renders traditional diffusion models unsuitable for characterizing consumers’ decisions on upgrade timing. In this study, we propose an Exponential-Decay proportional hazard model (Expo-Decay model) to predict consumers’ time to product upgrade. The Expo-Decay model is parsimonious, interpretable, and performs better than do existing models. We apply the Expo-Decay model and three extensions to study consumers’ upgrade behavior for a sports video game series. Empirical results reveal that consumers’ previous adoption and usage patterns can help predict their timing to upgrades. In particular, we find that consumers who have adopted the immediate past generation and those who play games from previous generations more often tend to upgrade earlier, whereas those who specialize in a small subset of game modes tend to upgrade later. Further, we find that complex extensions to the Expo-Decay model do not lead to better prediction performance than does the baseline Expo-Decay model, whereas a time-variant extension that updates the values of covariates over time outperforms the baseline model with static data.
源语言英语
页(从-至)2067-2083
页数17
期刊Production and Operations Management
31
5
DOI
出版状态已出版 - 2022

Corresponding author email

zjiang@nju.edu.cn

Project sponsor

National Social Science Foundation of China
National Natural Science Foundation of China

Project No.

21ZDA033
72071104

成果物的来源

  • ABDC-A*
  • SCIE

指纹

探究 'Predicting upgrade timing for successive product generations: An exponential-decay proportional hazard model' 的科研主题。它们共同构成独一无二的指纹。

引用此