Investigating the real effect of China?s patent surge: New evidence from firm-level patent quality data
HM Wu (First Author), J Lin (Participant Author), HM Wu (Participant Author)
科研成果: 期刊稿件 › 期刊论文
HM Wu (First Author), J Lin (Participant Author), HM Wu (Participant Author)
科研成果: 期刊稿件 › 期刊论文